Author: Pawel Bienkowski
Product Code: SBEW0420
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This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors.
Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations).
It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible.
The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
In my opinion, the authors have produced a book that will be invaluable to those designing or using near-field measurement probes. This book shows “what” should be measured, “why” it needs to be measured, and “how” it should be measured.
Prof. Ing. Antonio Orlandi, PhD, IEEE Fellow UAq EMC Laboratory, University of L’Aquila L’Aquila, Italy
2. The Near Field and the Far Field
3. EMF Measurement Methods
4. Electric Field Measurement
5. Magnetic Field Measurement
6. Power Density Measurement
7. Directional Pattern Synthesis
8. Other Factors Limiting Measurement Accuracy
9. Photonic EMF Measurements
10. Final Comments
Pawel Bienkowski, Ph.D., is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw where he researches electromagnetic compatibility and electromagnetic field measurements and standards. He was born in Wroclaw in 1968 and is the author or co-author of over 100 publications and symposia presentations and over 20 patents.
Hubert Trzaska is a Professor in the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he is involved in researching electromagnetic field measurements and standards. He was born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). After World War II he was deported to Wroclaw, Poland (formerly Breslau, Germany). He is a Charter Member of the Bioelectromagnetic Society and is author or co-author of over 300 publications and symposia presentations and over 50 patents.