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Challenging Test Rigs for Power, Electronics, Motors and Drives

Conference

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Many people have to create test rigs either for research and development work, or for end of line production test in a production environment. Creation of these rigs frequently become significant projects with their own challenges.

Date and Time

29 November 2017 - 09:30-16:30

Location

Birmingham, United Kingdom - icon_popup  (See map)

Organiser

Organised by the Power Electronics Machines and Drives TPN. Contact Rob Allen at robertallen@theiet.org for more information.


About this event

Every motor and set of power electronics will undergo some form of testing, but the care and effort that goes in to creating these test rigs is often not recognised in its own right.

This one day seminar and accompanying exhibition will attempt to readdress this by exploring some of the challenges and creative solutions. Covering performance, validation and production tests the event will be of interest to those designing, proving or making motors, magnetic components, power electronics and drives.

Programme

The programme is currently being finalised, but we anticipate speakers will discuss, amongst other topics:

• Testing of power semiconductor devices
• Rotor temperature measurement
• Thermal measurement of motors and magnetic components
• Measurement of acoustic noise/vibration
• Characterisation of magnetic components/materials
• Testing of large machines and/or HVDC systems
• Motor Test
• Test rig safety
• Environmental and EMC test
• Industrial drives testing

Reasons to attend

• Learn new techniques and solutions to test and measurement challenges
• Meet community experts
• Meet community suppliers (see the latest technology)
• Networking

Cost

£25.00 per Registrant

Additional information

CALL FOR SPEAKERS

If you would like to be part of this Test Rigs event as a presenter please contact Rob Allen

Exhibition opportunities

This event will include an exhibition if you would like to be part of this please contact Rob Allen.



Register

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