High performance non-contact surface metrology for manufacturing and R&D
Date 08 May 2008
Time
13:00 - Registration
16:30 - Close
Location
Meeting Rooms 1 & 2, Dakota Eurocentral, M8, Motherwell, Scotland
Introduction
This seminar is aimed at manufacturers and those involved in R&D who have an interest in high-performance metrology of surfaces.
The seminar will provide:
- An introduction to interferometric surface metrology for managers and technical personnel engaged in manufacturing or R&D
- Gain a better understanding of the application of interferometry
- Demonstrations of Scanning White Light and Fizeau Interferometers for detailed surface profiling and surface form measurement
- An opportunity to have samples measured – contact us in advance for more details
This event has now taken place.
You are no longer able to register for this event.
Cost
This event is free to attend.
Programme
| 13:00 | Registration & demonstrations |
| 13:30 | Dr Carol David Daniel Lambda Photometrics Ltd |
| 14:00 | Characterising MEMS: A Comparison of the Techniques AvailableDr John Hedley, University of Newcastle |
| 14:30 | Tea & coffee break & demonstrations |
| 15:30 | Imaging Ultrathin Polymer Films by Scanning White Light InterferometryVasileios Koutsos, University of Edinburgh |
| 16:00 | Q & A session & demonstrations |