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Topic Title: Erratic Zs readings when testing within a data centre Topic Summary: Fluctuating final circuit Zs readings when testing within a data centre Created On: 24 July 2012 01:11 PM Status: Post and Reply |
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 24 July 2012 01:11 PM
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Just wondering if someone could shed some light on the cause & possible resolution on the issue below
I am currently testing a data centre but I have been unable to establish consistent circuit Zs readings. Using several different testing equipment the result is the same. A different/fluctuating result every time a test is carried out. We have analysed the power supply & this is steady with no harmful harmonic interference. There are large 1000kW UPS on site but I have never experienced this issue on other datacentre projects Any assistance any one  can give me in this matter would be greatly appreciated.
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